Mode-locked lasers in InP photonic integrated circuits

E.A.J.M. Bente, S. Latkowski, V. Moskalenko, M. Llorens Revull, M.S. Tahvili, K.A. Williams

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Abstract

In this paper an overview is presented of results obtained with mode-locked semiconductor laser systems that are monolithically integrated using a standardized photonic integration platform based on InP. The laser systems are operating around 1550nm. In this technology platform the basic components that form the laser circuits such as amplifiers, passive waveguides and filters, as well as the semiconductor processing are standardized. Several of the possibilities that such a standardized technology offer are demonstrated by a number of examples of realized devices such as low repetition rate mode-locked lasers, a stabilized comb system and a wide frequency comb source. © (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Original languageEnglish
Title of host publicationNovel In-Plane Semiconductor Lasers XVI
EditorsAlexey Belyanin, Peter Smowton
PublisherSPIE
Pages1-7
Number of pages7
ISBN (Electronic)9781510606876
ISBN (Print)978-1-5106-0688-3
DOIs
Publication statusPublished - 20 Feb 2017
EventNovel In-Plane Semiconductor Lasers XVI - San Francisco, United States
Duration: 28 Jan 201728 Jan 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10123
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceNovel In-Plane Semiconductor Lasers XVI
CountryUnited States
CitySan Francisco
Period28/01/1728/01/17

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Keywords

  • Mode-locked lasers
  • Photonic integrated circuits
  • Semiconductor lasers

Cite this

Bente, E. A. J. M., Latkowski, S., Moskalenko, V., Llorens Revull, M., Tahvili, M. S., & Williams, K. A. (2017). Mode-locked lasers in InP photonic integrated circuits. In A. Belyanin, & P. Smowton (Eds.), Novel In-Plane Semiconductor Lasers XVI (pp. 1-7). [101230F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10123). SPIE. https://doi.org/10.1117/12.2251469