Minimizing stand-by leakage power in static CMOS circuits.

S.R. Naidu, E.T.A.F. Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

25 Citations (Scopus)
Original languageEnglish
Title of host publicationProc. of the DATE conference 2001
Pages370-376
Publication statusPublished - 2001
Event4th Design, Automation and Test in Europe Conference (DATE 2001) - Munich, Germany
Duration: 12 Mar 200116 Mar 2001
Conference number: 4

Conference

Conference4th Design, Automation and Test in Europe Conference (DATE 2001)
Abbreviated titleDATE 2001
CountryGermany
CityMunich
Period12/03/0116/03/01

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