Minimizing stand-by leakage power in static CMOS circuits.

S.R. Naidu, E.T.A.F. Jacobs

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. of the DATE conference 2001
Pages	370-376
Publication status	Published - 2001
Event	4th Design, Automation and Test in Europe Conference (DATE 2001) - Munich, Germany Duration: 12 Mar 2001 → 16 Mar 2001 Conference number: 4

Conference	4th Design, Automation and Test in Europe Conference (DATE 2001)
Abbreviated title	DATE 2001
Country/Territory	Germany
City	Munich
Period	12/03/01 → 16/03/01

Cite this

@inproceedings{170108b1ccfc43e49e075cb4d48d523f,

title = "Minimizing stand-by leakage power in static CMOS circuits.",

author = "S.R. Naidu and E.T.A.F. Jacobs",

year = "2001",

language = "English",

pages = "370--376",

booktitle = "Proc. of the DATE conference 2001",

note = "4th Design, Automation and Test in Europe Conference (DATE 2001), DATE 2001 ; Conference date: 12-03-2001 Through 16-03-2001",

}