Millimeter-wave antenna measurement

J.A.G. Akkermans, R. Dijk, van, M.H.A.J. Herben

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

39 Citations (Scopus)
2 Downloads (Pure)


A novel approach is presented to accurately measure the scattering parameters as well as the radiation pattern of planar antennas that operate in the millimeter-wave frequency band. To avoid interconnection problems, RF probes have been used to connect to the antenna. These RF probes are normally used for the characterisation of devices on a semiconductor wafer. Here, they are used to characterise antennas that can be realised in any planar manufacturing technology. A completely planar transition is designed to transform the coplanar waveguide transmission line that is required by the RF probe to a microstrip line. It is shown that this transition can be de-embedded from the measurements. Moreover, a measurement setup has been built for the measurement of the far-field radiation pattern of millimeter-wave antennas and antenna arrays. This setup allows to connect the antenna under test with an RF probe and can measure the radiation pattern in the whole upper hemisphere.
Original languageEnglish
Title of host publicationProceedings of the 2007 European Microwave Conference (EuMC 2007) 9-12 october 2007, Munich, Germany
EditorsWeigel Robert
Place of PublicationLondon, United Kingdom
PublisherHorizon House Publications Ltd.
ISBN (Print)978-2-87487-001-9
Publication statusPublished - 2007
Event37th European Microwave Conference (EuMC 2007) - Munich, Germany
Duration: 9 Oct 200712 Oct 2007
Conference number: 37


Conference37th European Microwave Conference (EuMC 2007)
Abbreviated titleEuMC 2007


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