Abstract
A novel approach is presented to accurately measure the scattering parameters as well as the radiation pattern of planar antennas that operate in the millimeter-wave frequency band. To avoid interconnection problems, RF probes have been used to connect to the antenna. These RF probes are normally used for the characterisation of devices on a semiconductor wafer. Here, they are used to characterise antennas that can be realised in any planar manufacturing technology. A completely planar transition is designed to transform the coplanar waveguide transmission line that is required by the RF probe to a microstrip line. It is shown that this transition can be de-embedded from the measurements. Moreover, a measurement setup has been built for the measurement of the far-field radiation pattern of millimeter-wave antennas and antenna arrays. This setup allows to connect the antenna under test with an RF probe and can measure the radiation pattern in the whole upper hemisphere.
| Original language | English |
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| Title of host publication | Proceedings of the 2007 European Microwave Conference (EuMC 2007) 9-12 october 2007, Munich, Germany |
| Editors | Weigel Robert |
| Place of Publication | London, United Kingdom |
| Publisher | Horizon House Publications Ltd. |
| Pages | 83-86 |
| ISBN (Print) | 978-2-87487-001-9 |
| DOIs | |
| Publication status | Published - 2007 |
| Event | 37th European Microwave Conference (EuMC 2007) - Munich, Germany Duration: 9 Oct 2007 → 12 Oct 2007 Conference number: 37 |
Conference
| Conference | 37th European Microwave Conference (EuMC 2007) |
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| Abbreviated title | EuMC 2007 |
| Country/Territory | Germany |
| City | Munich |
| Period | 9/10/07 → 12/10/07 |