Microwave noise measurements on double barrier resonant tunneling diodes

J.J.M. Kwaspen, H.C. Heyker, J.I.M. Demarteau, Th.G. Roer, van de

    Research output: Book/ReportReportAcademic

    150 Downloads (Pure)
    Original languageEnglish
    Place of PublicationEindhoven
    PublisherEindhoven University of Technology
    Number of pages190
    ISBN (Print)90-6144-242-7
    Publication statusPublished - 1990

    Publication series

    NameEUT report. E, Fac. of Electrical Engineering
    Volume90-E-242
    ISSN (Print)0929-8533

    Cite this