Microwave noise measurements on double barrier resonant tunneling diodes

J.J.M. Kwaspen, H.C. Heyker, J.I.M. Demarteau, Th.G. Roer, van de

    Research output: Book/ReportReportAcademic

    51 Downloads (Pure)
    Original languageEnglish
    Place of PublicationEindhoven
    PublisherEindhoven University of Technology
    Number of pages190
    ISBN (Print)90-6144-242-7
    Publication statusPublished - 1990

    Publication series

    NameEUT report. E, Fac. of Electrical Engineering
    Volume90-E-242
    ISSN (Print)0929-8533

    Cite this

    Kwaspen, J. J. M., Heyker, H. C., Demarteau, J. I. M., & Roer, van de, T. G. (1990). Microwave noise measurements on double barrier resonant tunneling diodes. (EUT report. E, Fac. of Electrical Engineering; Vol. 90-E-242). Eindhoven: Eindhoven University of Technology.