Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

J.J.M. Kwaspen, H.C. Heyker

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 1997 IEEE/LEOS Benelux Chapter Symposium
Pages217-220
Publication statusPublished - 1997
Event2nd Annual Symposium of the IEEE/LEOS Benelux Chapter - Eindhoven, Netherlands
Duration: 26 Nov 199726 Nov 1997

Conference

Conference2nd Annual Symposium of the IEEE/LEOS Benelux Chapter
CountryNetherlands
CityEindhoven
Period26/11/9726/11/97

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