Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

J.J.M. Kwaspen, H.C. Heyker

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 1997 IEEE/LEOS Benelux Chapter Symposium
Pages	217-220
Publication status	Published - 1997
Event	2nd Annual Symposium of the IEEE/LEOS Benelux Chapter - Eindhoven, Netherlands Duration: 26 Nov 1997 → 26 Nov 1997

Conference	2nd Annual Symposium of the IEEE/LEOS Benelux Chapter
Country/Territory	Netherlands
City	Eindhoven
Period	26/11/97 → 26/11/97

Cite this

@inproceedings{d1830d1494e44d0dadcdcd2975e3d971,

title = "Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs",

author = "J.J.M. Kwaspen and H.C. Heyker",

year = "1997",

language = "English",

isbn = "90-73461-13-8",

pages = "217--220",

booktitle = "Proc. 1997 IEEE/LEOS Benelux Chapter Symposium",

note = "2nd Annual Symposium of the IEEE/LEOS Benelux Chapter ; Conference date: 26-11-1997 Through 26-11-1997",

}

TY - GEN

T1 - Microwave-behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

AU - Kwaspen, J.J.M.

AU - Heyker, H.C.

PY - 1997

Y1 - 1997

M3 - Conference contribution

SN - 90-73461-13-8

SP - 217

EP - 220

BT - Proc. 1997 IEEE/LEOS Benelux Chapter Symposium

T2 - 2nd Annual Symposium of the IEEE/LEOS Benelux Chapter

Y2 - 26 November 1997 through 26 November 1997

ER -