Microscopic reflection difference spectroscopy on semiconductor nanostructures

B. Koopmans, P.V. Santos, M. Cardona

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

24 Citations (Scopus)

Abstract

Several aspects of extending reflection difference spectroscopy (RDS) to sub-micrometer-, and possibly even nanometer-, resolution are discussed. Details of our recently developed µRDS technique, and an analysis of artifacts in non-ideal systems, are presented. We performed macroscopic and microscopic RDS experiments on GaAs/AlGaAs quantum wells in several configurations, including the in-plane anisotropy for asymmetric quantum wells, and the confinement-induced anisotropy for in-plane wave propagation. The experimental results are interpreted in terms of empirical tight-binding calculations and phenomenological models.
Original languageEnglish
Title of host publicationEPIOPTICS 5
Pages307-315
DOIs
Publication statusPublished - 1998

Publication series

NamePhysica Status Solidi A : Applied Research
Volume170
ISSN (Print)0031-8965

Fingerprint Dive into the research topics of 'Microscopic reflection difference spectroscopy on semiconductor nanostructures'. Together they form a unique fingerprint.

Cite this