TY - GEN
T1 - Microscopic reflection difference spectroscopy on semiconductor nanostructures
AU - Koopmans, B.
AU - Santos, P.V.
AU - Cardona, M.
PY - 1998
Y1 - 1998
N2 - Several aspects of extending reflection difference spectroscopy (RDS) to sub-micrometer-, and possibly even nanometer-, resolution are discussed. Details of our recently developed µRDS technique, and an analysis of artifacts in non-ideal systems, are presented. We performed macroscopic and microscopic RDS experiments on GaAs/AlGaAs quantum wells in several configurations, including the in-plane anisotropy for asymmetric quantum wells, and the confinement-induced anisotropy for in-plane wave propagation. The experimental results are interpreted in terms of empirical tight-binding calculations and phenomenological models.
AB - Several aspects of extending reflection difference spectroscopy (RDS) to sub-micrometer-, and possibly even nanometer-, resolution are discussed. Details of our recently developed µRDS technique, and an analysis of artifacts in non-ideal systems, are presented. We performed macroscopic and microscopic RDS experiments on GaAs/AlGaAs quantum wells in several configurations, including the in-plane anisotropy for asymmetric quantum wells, and the confinement-induced anisotropy for in-plane wave propagation. The experimental results are interpreted in terms of empirical tight-binding calculations and phenomenological models.
U2 - 10.1002/(SICI)1521-396X(199812)170:2<307::AID-PSSA307>3.3.CO;2-Q
DO - 10.1002/(SICI)1521-396X(199812)170:2<307::AID-PSSA307>3.3.CO;2-Q
M3 - Conference contribution
T3 - Physica Status Solidi A : Applied Research
SP - 307
EP - 315
BT - EPIOPTICS 5
ER -