Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration

A. Kappatou; R.J.E. Jaspers; E.G. Delabie; O. Marchuk; W. (Wolfgang) Biel; M.A. Jakobs

doi:10.1063/1.4732847

Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration

A. Kappatou, R.J.E. Jaspers, E.G. Delabie, O. Marchuk, W. (Wolfgang) Biel, M.A. Jakobs

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Abstract

Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.

Original language	English
Article number	10D519
Pages (from-to)	10D519-1/3
Number of pages	3
Journal	Review of Scientific Instruments
Volume	83
Issue number	10
DOIs	https://doi.org/10.1063/1.4732847
Publication status	Published - 2012

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title = "Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration",

abstract = "Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.",

author = "A. Kappatou and R.J.E. Jaspers and E.G. Delabie and O. Marchuk and Biel, {W. (Wolfgang)} and M.A. Jakobs",

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T1 - Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration

AU - Kappatou, A.

AU - Jaspers, R.J.E.

AU - Delabie, E.G.

AU - Marchuk, O.

AU - Biel, W. (Wolfgang)

AU - Jakobs, M.A.

PY - 2012

Y1 - 2012

N2 - Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.

AB - Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.

U2 - 10.1063/1.4732847

DO - 10.1063/1.4732847

M3 - Article

C2 - 23126860

SN - 0034-6748

VL - 83

SP - 10D519-1/3

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 10

M1 - 10D519

ER -

Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration

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