|Patent number||US Patent #5,590,275|
|Publication status||Published - 31 Dec 1996|
Berkel, van, C. H., Roncken, M., & Saeijs, R. W. J. J. (1996). Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components. (Patent No. US Patent #5,590,275).