Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components

C.H. Berkel, van (Inventor), M. Roncken (Inventor), R.W.J.J. Saeijs (Inventor)

    Research output: PatentPatent publication

    Original languageEnglish
    Patent numberUS Patent #5,590,275
    Publication statusPublished - 31 Dec 1996

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