Method for polarization-resolved measurement of electroabsorption

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Photonic integrated circuits often use semiconductor components such as amplifiers, detectors, and electroabsorption modulators. For a proper circuit design, it is important to know the absorption spectrum of these semiconductor optical components and how it depends on an applied electric field. We propose a fast and accurate method that uses a compact segmented contact structure to measure the absorption characteristics. The method is based on measuring the transmission of amplified spontaneous emission (ASE) from a single forward-biased section through a varying number of reversely biased absorbing sections. Provided the ASE source emits light in both polarizations, the method measures the absorption spectra for both polarization modes simultaneously, without the need for a polarization filter in the measurement setup.

Original languageEnglish
Title of host publication31st Annual Conference of the IEEE Photonics Society, IPC 2018
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Number of pages11
ISBN (Electronic)978-1-5386-5358-6
ISBN (Print)978-1-5386-5359-3
Publication statusPublished - 6 Nov 2018
Event31st IEEE Photonics Conference, IPC 2018 - Reston, United States
Duration: 30 Sept 20184 Oct 2018
Conference number: 31


Conference31st IEEE Photonics Conference, IPC 2018
Abbreviated titleIPC 2018
Country/TerritoryUnited States
Internet address


  • Absorption measurement
  • Active-passive integration
  • Photonic integrated circuits
  • Polarization
  • Segmented device
  • Semiconductor optical amplifiers


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