Method for polarization-resolved measurement of electroabsorption

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Abstract

Photonic integrated circuits often use semiconductor components such as amplifiers, detectors, and electroabsorption modulators. For a proper circuit design, it is important to know the absorption spectrum of these semiconductor optical components and how it depends on an applied electric field. We propose a fast and accurate method that uses a compact segmented contact structure to measure the absorption characteristics. The method is based on measuring the transmission of amplified spontaneous emission (ASE) from a single forward-biased section through a varying number of reversely biased absorbing sections. Provided the ASE source emits light in both polarizations, the method measures the absorption spectra for both polarization modes simultaneously, without the need for a polarization filter in the measurement setup.

Original languageEnglish
Title of host publication31st Annual Conference of the IEEE Photonics Society, IPC 2018
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Number of pages11
ISBN (Electronic)978-1-5386-5358-6
ISBN (Print)978-1-5386-5359-3
DOIs
Publication statusPublished - 6 Nov 2018
Event31st Annual Conference of the IEEE Photonics Society, (IPC2018) - Reston, United States
Duration: 30 Sep 20184 Oct 2018
https://www.conferenceabstracts.com/cfp2/login.asp?EventKey=DSUSJYRO

Conference

Conference31st Annual Conference of the IEEE Photonics Society, (IPC2018)
Abbreviated titleIPC2018
CountryUnited States
CityReston
Period30/09/184/10/18
Internet address

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Keywords

  • Absorption measurement
  • Active-passive integration
  • Photonic integrated circuits
  • Polarization
  • Segmented device
  • Semiconductor optical amplifiers

Cite this

Pustakhod, D., Williams, K., & Leijtens, X. (2018). Method for polarization-resolved measurement of electroabsorption. In 31st Annual Conference of the IEEE Photonics Society, IPC 2018 [8527094] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IPCon.2018.8527094