Abstract
A method for improving writability of an SRAM cell is disclosed. In one aspect, the method includes applying a first voltage higher than the global ground voltage and a third voltage higher than the global supply voltage to the ground supply nodes of the invertors of the SRAM cell, pre-charging one of the complementary bitlines to the global ground voltage, and applying a second voltage higher than the global supply voltage to the access transistors during a write operation to the SRAM cell.
Original language | English |
---|---|
Patent number | US2012063211 |
IPC | G11C 11/ 00 A I |
Priority date | 13/09/11 |
Publication status | Published - 15 Mar 2012 |
Externally published | Yes |