Abstract
We present a method to characterize the efficiency and optical loss of an electro-optic phase modulator (EOPM). The efficiency and loss are not constant but change with wavelength and bias voltage, although in literature often only a single value is given. Our characterization method better represents the performance and provides valuable insight into the device operation. No integrated passive structures are required, making it a straightforward and widely applicable characterization method. We applied the method to EOPMs of different lengths. The results show the trade-off between efficiency and optical loss. They are used to find the optimum operating point and to design and optimize the EOPM layer stack.
| Original language | English |
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| Title of host publication | Proceedings of the 28th Annual Symposium of the IEEE Photonics Benelux Chapter |
| Number of pages | 4 |
| Publication status | Accepted/In press - 2024 |
| Event | 28th Annual Symposium of the IEEE Photonics Benelux Chapter - University of Twente, Enschede, Netherlands Duration: 4 Nov 2024 → 5 Nov 2024 Conference number: 28 https://www.aanmelder.nl/ieee-photonics-benelux-2024 |
Conference
| Conference | 28th Annual Symposium of the IEEE Photonics Benelux Chapter |
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| Abbreviated title | IEEE Benelux 2024 |
| Country/Territory | Netherlands |
| City | Enschede |
| Period | 4/11/24 → 5/11/24 |
| Internet address |
Keywords
- characterization
- electro-optic modulators
- Fabry-Pérot interferometers
- optical losses
- phase shifting