TY - JOUR
T1 - Mesoscopic concentration variations analyzed by secondary ion mass spectrometry
AU - Kjellander, B.K.C.
AU - IJzendoorn, van, L.J.
AU - Jong, de, A.M.
AU - Broer, D.J.
AU - Niemantsverdriet, J.W.
PY - 2005
Y1 - 2005
N2 - Secondary ion mass spectrometry (SIMS) was used to identify concentration gradients of polyacrylate samples. Applying discriminant function analysis (DFA) on the SIMS spectra resulted in visualized separations between different sample concentrations. We identified and separated concentrations of polyacrylate blends; from the separation we can construct calibration curves. The visual identification was followed in depth of a poly(fluoro-acrylate) film covered by poly(iso-bornylmethacrylate), which served as model sample of a photo-induced phase separated device. The combination of SIMS and DFA offers new possibilities to study the phase separation processes. Furthermore, it can predict how the phase separation creates mesoscopic layered electro-optical devices.
AB - Secondary ion mass spectrometry (SIMS) was used to identify concentration gradients of polyacrylate samples. Applying discriminant function analysis (DFA) on the SIMS spectra resulted in visualized separations between different sample concentrations. We identified and separated concentrations of polyacrylate blends; from the separation we can construct calibration curves. The visual identification was followed in depth of a poly(fluoro-acrylate) film covered by poly(iso-bornylmethacrylate), which served as model sample of a photo-induced phase separated device. The combination of SIMS and DFA offers new possibilities to study the phase separation processes. Furthermore, it can predict how the phase separation creates mesoscopic layered electro-optical devices.
U2 - 10.1080/15421400590955613
DO - 10.1080/15421400590955613
M3 - Article
SN - 1542-1406
VL - 434
SP - 499
EP - 510
JO - Molecular Crystals and Liquid Crystals
JF - Molecular Crystals and Liquid Crystals
ER -