Mechanical failure prediction of copper/low-k interconnects in integrated circuits

B.A.E. Hal, van, R.H.J. Peerlings

Research output: Contribution to conferencePoster

45 Downloads (Pure)
Original languageEnglish
Publication statusPublished - 2005
EventMate Poster Award 2005 : 10th Annual Poster Contest -
Duration: 1 Jan 2005 → …

Conference

ConferenceMate Poster Award 2005 : 10th Annual Poster Contest
Period1/01/05 → …
OtherMate Poster Award 2005 : 10th Annual Poster Contest

Cite this

Hal, van, B. A. E., & Peerlings, R. H. J. (2005). Mechanical failure prediction of copper/low-k interconnects in integrated circuits. Poster session presented at Mate Poster Award 2005 : 10th Annual Poster Contest, .