Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope

M. Kemerink, P. Offermans, P.M. Koenraad, J.K.J. Duren, van, R.A.J. Janssen, H.W.M. Salemink, J.H. Wolter

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Abstract

For the 1st time, we directly measured the potential distribution inside org. semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning tunneling microscope (STM). The results are analyzed with a model that treats both current injection and bulk transport in detail. Tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode
Original languageEnglish
Pages (from-to)1247-1250
JournalPhysica E: Low-Dimensional Systems & Nanostructures
Volume13
Issue number2-4
DOIs
Publication statusPublished - 2002

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