Measuring the light emission profile in organic light-emitting diodes with nanometre spatial resolution

S.L.M. Mensfoort, van; M. Carvelli; M. Megens; D.J. Wehenkel; M. Bartyzel; H. Greiner; R.A.J. Janssen; R. Coehoorn

doi:10.1038/NPHOTON.2010.32

Measuring the light emission profile in organic light-emitting diodes with nanometre spatial resolution

S.L.M. Mensfoort, van, M. Carvelli, M. Megens, D.J. Wehenkel, M. Bartyzel, H. Greiner, R.A.J. Janssen, R. Coehoorn

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Abstract

Determining the precise shape of the emission profile across the thickness of the active layer in organic light-emitting diodes is of importance for device optimization and assessing the validity of advanced device models. We present a comprehensive method for accurately measuring the shape of the emission profile, the intrinsic spectrum of emitting dipoles and the emitting dipole orientation. The method uses a microcavity light outcoupling model, which includes self-absorption and optical anisotropy, and is based on the full wavelength, angle and polarization resolved emission intensity. Application to blue (polyfluorene-based) and orange-red (NRS-PPV) polymer organic light-emitting diodes reveals a peaked shape of the emission profile. A significant voltage and layer thickness dependence of the peak positions is observed, with a demonstrated resolution better than 5 nm.

Original language	English
Pages (from-to)	329-335
Number of pages	7
Journal	Nature Photonics
Volume	4
Issue number	5
DOIs	https://doi.org/10.1038/NPHOTON.2010.32
Publication status	Published - 2010

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title = "Measuring the light emission profile in organic light-emitting diodes with nanometre spatial resolution",

abstract = "Determining the precise shape of the emission profile across the thickness of the active layer in organic light-emitting diodes is of importance for device optimization and assessing the validity of advanced device models. We present a comprehensive method for accurately measuring the shape of the emission profile, the intrinsic spectrum of emitting dipoles and the emitting dipole orientation. The method uses a microcavity light outcoupling model, which includes self-absorption and optical anisotropy, and is based on the full wavelength, angle and polarization resolved emission intensity. Application to blue (polyfluorene-based) and orange-red (NRS-PPV) polymer organic light-emitting diodes reveals a peaked shape of the emission profile. A significant voltage and layer thickness dependence of the peak positions is observed, with a demonstrated resolution better than 5 nm.",

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T1 - Measuring the light emission profile in organic light-emitting diodes with nanometre spatial resolution

AU - Mensfoort, van, S.L.M.

AU - Carvelli, M.

AU - Megens, M.

AU - Wehenkel, D.J.

AU - Bartyzel, M.

AU - Greiner, H.

AU - Janssen, R.A.J.

AU - Coehoorn, R.

PY - 2010

Y1 - 2010

N2 - Determining the precise shape of the emission profile across the thickness of the active layer in organic light-emitting diodes is of importance for device optimization and assessing the validity of advanced device models. We present a comprehensive method for accurately measuring the shape of the emission profile, the intrinsic spectrum of emitting dipoles and the emitting dipole orientation. The method uses a microcavity light outcoupling model, which includes self-absorption and optical anisotropy, and is based on the full wavelength, angle and polarization resolved emission intensity. Application to blue (polyfluorene-based) and orange-red (NRS-PPV) polymer organic light-emitting diodes reveals a peaked shape of the emission profile. A significant voltage and layer thickness dependence of the peak positions is observed, with a demonstrated resolution better than 5 nm.

AB - Determining the precise shape of the emission profile across the thickness of the active layer in organic light-emitting diodes is of importance for device optimization and assessing the validity of advanced device models. We present a comprehensive method for accurately measuring the shape of the emission profile, the intrinsic spectrum of emitting dipoles and the emitting dipole orientation. The method uses a microcavity light outcoupling model, which includes self-absorption and optical anisotropy, and is based on the full wavelength, angle and polarization resolved emission intensity. Application to blue (polyfluorene-based) and orange-red (NRS-PPV) polymer organic light-emitting diodes reveals a peaked shape of the emission profile. A significant voltage and layer thickness dependence of the peak positions is observed, with a demonstrated resolution better than 5 nm.

U2 - 10.1038/NPHOTON.2010.32

DO - 10.1038/NPHOTON.2010.32

M3 - Article

SN - 1749-4885

VL - 4

SP - 329

EP - 335

JO - Nature Photonics

JF - Nature Photonics

IS - 5

ER -

Measuring the light emission profile in organic light-emitting diodes with nanometre spatial resolution

Abstract

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