Measuring and modelling the bias dependent series resistance in submicron MOSFETs

J.A.M. Otten, F.M. Klaassen

Research output: Book/ReportReportAcademic

LanguageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages60
StatePublished - 1994

Bibliographical note

Final report ESPRIT-ADWEUAT project 7236

Cite this

Otten, J. A. M., & Klaassen, F. M. (1994). Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven: Technische Universiteit Eindhoven.
Otten, J.A.M. ; Klaassen, F.M./ Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven : Technische Universiteit Eindhoven, 1994. 60 p.
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Otten, JAM & Klaassen, FM 1994, Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Technische Universiteit Eindhoven, Eindhoven.

Measuring and modelling the bias dependent series resistance in submicron MOSFETs. / Otten, J.A.M.; Klaassen, F.M.

Eindhoven : Technische Universiteit Eindhoven, 1994. 60 p.

Research output: Book/ReportReportAcademic

TY - BOOK

T1 - Measuring and modelling the bias dependent series resistance in submicron MOSFETs

AU - Otten,J.A.M.

AU - Klaassen,F.M.

N1 - Final report ESPRIT-ADWEUAT project 7236

PY - 1994

Y1 - 1994

M3 - Report

BT - Measuring and modelling the bias dependent series resistance in submicron MOSFETs

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

Otten JAM, Klaassen FM. Measuring and modelling the bias dependent series resistance in submicron MOSFETs. Eindhoven: Technische Universiteit Eindhoven, 1994. 60 p.