| Original language | English |
|---|---|
| Place of Publication | Eindhoven |
| Publisher | Technische Universiteit Eindhoven |
| Number of pages | 60 |
| Publication status | Published - 1994 |
Measuring and modelling the bias dependent series resistance in submicron MOSFETs
J.A.M. Otten, F.M. Klaassen
Research output: Book/Report › Report › Academic