Measurement of strain fields in the micron range

S.A. Onraet, W.P. Vellinga, M.G.D. Geers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationProceedings 3rd international conference and poster exhibition micromaterials, MicroMat 2000, April 17-19, 2000, Berlin, Germany
EditorsB. Michel
Place of PublicationDresden
PublisherVerlag DDP Goldenbogen
ISBN (Print)3-932434-15-3
Publication statusPublished - 2000

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