Materials analysis with Rutherford backscattering spectrometry; application to catalysts

L.J. IJzendoorn, van; M.J.A. Voigt, de; J.W. Niemantsverdriet

doi:10.1007/BF02062199

Materials analysis with Rutherford backscattering spectrometry; application to catalysts

L.J. IJzendoorn, van, M.J.A. Voigt, de, J.W. Niemantsverdriet

Research output: Contribution to journal › Article › Academic › peer-review

4 Citations (Scopus)

601 Downloads (Pure)

Abstract

Rutherford Backscattering Spectrometry (RBS) is a powerful tool in the anal. of model catalysts. The surface coverage of various metals on thin SiO2 layers on Si and thin Al2O3 layers on Al can be accurately measured, while simultaneously depth profiles of the metals are obtained. The scattering technique is reviewed and several applications in the prepn. of model catalysts by wet chem. methods are presented. [on SciFinder (R)]

Original language	English
Pages (from-to)	131-137
Journal	Reaction Kinetics and Catalysis Letters
Volume	50
Issue number	1-2
DOIs	https://doi.org/10.1007/BF02062199
Publication status	Published - 1993

Access to Document

10.1007/BF02062199

621563Final published version, 252 KB

Cite this

@article{06ccb44f1a2c4e15825ccfae5b070dc7,

title = "Materials analysis with Rutherford backscattering spectrometry; application to catalysts",

abstract = "Rutherford Backscattering Spectrometry (RBS) is a powerful tool in the anal. of model catalysts. The surface coverage of various metals on thin SiO2 layers on Si and thin Al2O3 layers on Al can be accurately measured, while simultaneously depth profiles of the metals are obtained. The scattering technique is reviewed and several applications in the prepn. of model catalysts by wet chem. methods are presented. [on SciFinder (R)]",

author = "{IJzendoorn, van}, L.J. and {Voigt, de}, M.J.A. and J.W. Niemantsverdriet",

year = "1993",

doi = "10.1007/BF02062199",

language = "English",

volume = "50",

pages = "131--137",

journal = "Reaction Kinetics and Catalysis Letters",

issn = "0133-1736",

publisher = "Akademiai Kiad{\'o}",

number = "1-2",

}

TY - JOUR

T1 - Materials analysis with Rutherford backscattering spectrometry; application to catalysts

AU - IJzendoorn, van, L.J.

AU - Voigt, de, M.J.A.

AU - Niemantsverdriet, J.W.

PY - 1993

Y1 - 1993

N2 - Rutherford Backscattering Spectrometry (RBS) is a powerful tool in the anal. of model catalysts. The surface coverage of various metals on thin SiO2 layers on Si and thin Al2O3 layers on Al can be accurately measured, while simultaneously depth profiles of the metals are obtained. The scattering technique is reviewed and several applications in the prepn. of model catalysts by wet chem. methods are presented. [on SciFinder (R)]

AB - Rutherford Backscattering Spectrometry (RBS) is a powerful tool in the anal. of model catalysts. The surface coverage of various metals on thin SiO2 layers on Si and thin Al2O3 layers on Al can be accurately measured, while simultaneously depth profiles of the metals are obtained. The scattering technique is reviewed and several applications in the prepn. of model catalysts by wet chem. methods are presented. [on SciFinder (R)]

U2 - 10.1007/BF02062199

DO - 10.1007/BF02062199

M3 - Article

SN - 0133-1736

VL - 50

SP - 131

EP - 137

JO - Reaction Kinetics and Catalysis Letters

JF - Reaction Kinetics and Catalysis Letters

IS - 1-2

ER -

Materials analysis with Rutherford backscattering spectrometry; application to catalysts

Abstract

Access to Document

Fingerprint

Cite this