Mapping and Controlling Liquid Layer Thickness in Liquid-Phase (Scanning) Transmission Electron Microscopy

Hanglong Wu, Hao Su, Rick R.M. Joosten, Arthur D.A. Keizer, Laura S. van Hazendonk, Maarten J.M. Wirix, Joseph P. Patterson, Jozua Laven, Gijsbertus de With, Heiner Friedrich (Corresponding author)

Research output: Contribution to journal › Article › Academic › peer-review

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Center for Multiscale Electron Microscopy (CMEM)
Friedrich, H. (Manager), Joosten, R. (Education/research officer), Schmit, P. (Education/research officer), Schreur - Piet, I. (Other) & Spoelstra, A. (Education/research officer)
Physical Chemistry
Facility/equipment: Research lab