Maintaining quality and reliability in rapid product development processes

A.C. Brombacher, M. Graef, de, H.T. Loh, Y. Lu, S. Minderhoud, P.H. Ouden, den, H.S. Tan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the Conference on Performance Measurements for R&D, 11-12 June 2001, Sheraton Towers, Singapore
    EditorsI. Sio
    Place of PublicationSingapore
    PublisherAsia Business Forum
    Publication statusPublished - 2001

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