TY - JOUR
T1 - Magnetic field-enhanced beam monitor for ionizing radiation
AU - Platier, Bart
AU - Limpens, R.
AU - Lassise, A.
AU - Oosterholt, Tom T.J.
AU - van Ninhuijs, Mark
AU - Daamen, K.A.
AU - Staps, Tim J.A.
AU - Zangrando, Marco
AU - Luiten, O.J.
AU - IJzerman, Wilbert L.
AU - Beckers, Job
PY - 2020/6/9
Y1 - 2020/6/9
N2 - For the microwave cavity resonance spectroscopy based non-destructive beam monitor for ionizing radiation, an addition—which adapts the approach to conditions where only little ionization takes place due to, e.g., small ionization cross sections, low gas pressures, and low photon fluxes—is presented and demonstrated. In this experiment, a magnetic field with a strength of 57 ± 1 mT was used to extend the lifetime of the afterglow of an extreme ultraviolet-induced plasma by a factor of ∼5. Magnetic trapping is expected to be most successful in preventing the decay of ephemeral free electrons created by low-energy photons. Good agreement has been found between the experimental results and the decay rates calculated based on the ambipolar and classical collision diffusion models.
AB - For the microwave cavity resonance spectroscopy based non-destructive beam monitor for ionizing radiation, an addition—which adapts the approach to conditions where only little ionization takes place due to, e.g., small ionization cross sections, low gas pressures, and low photon fluxes—is presented and demonstrated. In this experiment, a magnetic field with a strength of 57 ± 1 mT was used to extend the lifetime of the afterglow of an extreme ultraviolet-induced plasma by a factor of ∼5. Magnetic trapping is expected to be most successful in preventing the decay of ephemeral free electrons created by low-energy photons. Good agreement has been found between the experimental results and the decay rates calculated based on the ambipolar and classical collision diffusion models.
UR - http://www.scopus.com/inward/record.url?scp=85087473388&partnerID=8YFLogxK
U2 - 10.1063/5.0007092
DO - 10.1063/5.0007092
M3 - Article
C2 - 32611041
AN - SCOPUS:85087473388
SN - 0034-6748
VL - 91
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 6
M1 - 063503
ER -