Magnetic and structural properties of EuS-PbS multilayers grown on n-PbS (100) substrates

M. Chernyshova; E. Lusakowska; V. Domukhovski; K. Grasza; A. Szczerbakow; S. Wrotek; L. Kowalczyk; T. Story; C.J.P. Smits; H.J.M. Swagten; W.J.M. Jonge, de; W. Palosz; A.Y. Sipatov; V.V. Volobuev

Magnetic and structural properties of EuS-PbS multilayers grown on n-PbS (100) substrates

M. Chernyshova, E. Lusakowska, V. Domukhovski, K. Grasza, A. Szczerbakow, S. Wrotek, L. Kowalczyk, T. Story, C.J.P. Smits, H.J.M. Swagten, W.J.M. Jonge, de, W. Palosz, A.Y. Sipatov, V.V. Volobuev

Physics of Nanostructures

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Abstract

Magnetic properties of semiconductor EuS(t)-PbS(d)-EuS(t) ferromagnetic trilayers (t=30÷300 A and d=7.5÷70 A) grown on n-type monocrystalline PbS (100) substrate were studied by SQUID magnetometry and ferromagnetic resonance technique yielding, in particular, the dependence of the ferromagnetic Curie temperature on the thickness of the EuS layer. Structural parameters of layers were examined by X-ray powder diffraction analysis. A high structural quality of the substrate and the multilayer was verified by the measurements of the X-ray rocking curve width indicating the values of the order of 100 arcsec and by atomic force microscopy revealing the presence on the cleft PbS surface regions practically flat in the atomic scale over the area of 1x0.1µm2.

Original language	English
Pages (from-to)	609-615
Number of pages	7
Journal	Acta Physica Polonica A
Volume	102
Issue number	4-5
Publication status	Published - 2002

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title = "Magnetic and structural properties of EuS-PbS multilayers grown on n-PbS (100) substrates",

abstract = "Magnetic properties of semiconductor EuS(t)-PbS(d)-EuS(t) ferromagnetic trilayers (t=30÷300 A and d=7.5÷70 A) grown on n-type monocrystalline PbS (100) substrate were studied by SQUID magnetometry and ferromagnetic resonance technique yielding, in particular, the dependence of the ferromagnetic Curie temperature on the thickness of the EuS layer. Structural parameters of layers were examined by X-ray powder diffraction analysis. A high structural quality of the substrate and the multilayer was verified by the measurements of the X-ray rocking curve width indicating the values of the order of 100 arcsec and by atomic force microscopy revealing the presence on the cleft PbS surface regions practically flat in the atomic scale over the area of 1x0.1µm2.",

author = "M. Chernyshova and E. Lusakowska and V. Domukhovski and K. Grasza and A. Szczerbakow and S. Wrotek and L. Kowalczyk and T. Story and C.J.P. Smits and H.J.M. Swagten and {Jonge, de}, W.J.M. and W. Palosz and A.Y. Sipatov and V.V. Volobuev",

year = "2002",

language = "English",

volume = "102",

pages = "609--615",

journal = "Acta Physica Polonica A",

issn = "0587-4246",

publisher = "Polish Academy of Sciences",

number = "4-5",

}

TY - JOUR

T1 - Magnetic and structural properties of EuS-PbS multilayers grown on n-PbS (100) substrates

AU - Chernyshova, M.

AU - Lusakowska, E.

AU - Domukhovski, V.

AU - Grasza, K.

AU - Szczerbakow, A.

AU - Wrotek, S.

AU - Kowalczyk, L.

AU - Story, T.

AU - Smits, C.J.P.

AU - Swagten, H.J.M.

AU - Jonge, de, W.J.M.

AU - Palosz, W.

AU - Sipatov, A.Y.

AU - Volobuev, V.V.

PY - 2002

Y1 - 2002

N2 - Magnetic properties of semiconductor EuS(t)-PbS(d)-EuS(t) ferromagnetic trilayers (t=30÷300 A and d=7.5÷70 A) grown on n-type monocrystalline PbS (100) substrate were studied by SQUID magnetometry and ferromagnetic resonance technique yielding, in particular, the dependence of the ferromagnetic Curie temperature on the thickness of the EuS layer. Structural parameters of layers were examined by X-ray powder diffraction analysis. A high structural quality of the substrate and the multilayer was verified by the measurements of the X-ray rocking curve width indicating the values of the order of 100 arcsec and by atomic force microscopy revealing the presence on the cleft PbS surface regions practically flat in the atomic scale over the area of 1x0.1µm2.

AB - Magnetic properties of semiconductor EuS(t)-PbS(d)-EuS(t) ferromagnetic trilayers (t=30÷300 A and d=7.5÷70 A) grown on n-type monocrystalline PbS (100) substrate were studied by SQUID magnetometry and ferromagnetic resonance technique yielding, in particular, the dependence of the ferromagnetic Curie temperature on the thickness of the EuS layer. Structural parameters of layers were examined by X-ray powder diffraction analysis. A high structural quality of the substrate and the multilayer was verified by the measurements of the X-ray rocking curve width indicating the values of the order of 100 arcsec and by atomic force microscopy revealing the presence on the cleft PbS surface regions practically flat in the atomic scale over the area of 1x0.1µm2.

M3 - Article

SN - 0587-4246

VL - 102

SP - 609

EP - 615

JO - Acta Physica Polonica A

JF - Acta Physica Polonica A

IS - 4-5

ER -

Magnetic and structural properties of EuS-PbS multilayers grown on n-PbS (100) substrates

Abstract

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