Low frequency noise as a diagnostic tool for quality assessment of MOSFETs

E.P. Vandamme, C. Claeys, L.K.J. Vandamme

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. ELEN Workshop
Pages107-114
Publication statusPublished - 1994
Eventconference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994 -
Duration: 1 Jan 1994 → …

Conference

Conferenceconference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994
Period1/01/94 → …
OtherProc. ELEN Workshop, Montpellier, France, 18-20 October 1994

Cite this

Vandamme, E. P., Claeys, C., & Vandamme, L. K. J. (1994). Low frequency noise as a diagnostic tool for quality assessment of MOSFETs. In Proc. ELEN Workshop (pp. 107-114)