Low frequency noise as a diagnostic tool for quality assessment of MOSFETs

E.P. Vandamme, C. Claeys, L.K.J. Vandamme

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. ELEN Workshop
Pages	107-114
Publication status	Published - 1994
Event	conference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994 - Duration: 1 Jan 1994 → …

Conference	conference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994
Period	1/01/94 → …
Other	Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994

Cite this

@inproceedings{8018a74a4bd942a9ac04aa4cc1b61ea2,

title = "Low frequency noise as a diagnostic tool for quality assessment of MOSFETs",

author = "E.P. Vandamme and C. Claeys and L.K.J. Vandamme",

year = "1994",

language = "English",

pages = "107--114",

booktitle = "Proc. ELEN Workshop",

note = "conference; Proc. ELEN Workshop, Montpellier, France, 18-20 October 1994 ; Conference date: 01-01-1994",

}