The behaviour and the possible applications of nanoparticles are strongly dictated by the properties of their outer surface, as this determines the interaction with the environment. Analytical techniques with a high level of surface sensitivity are thus required to study this aspect. Low-energy ion scattering (LEIS) is a surface analytical technique with the unique capability of determining the elemental composition of the single top atomic layer of a sample, making it ideally suited for the analysis of nanoparticles. This chapter will give an introduction to the fundamentals of the LEIS technique, followed by application examples chosen from a range of fields including catalysis, core–shell nanoparticles for sensor applications, and functionalized nanoparticles.
|Title of host publication||Characterization of nanoparticles|
|Subtitle of host publication||Measurement processes for nanoparticles.|
|Editors||Vasile-Dan Hodoroaba, Wolfgang E.S. Unger, Alexander G. Shard|
|Number of pages||21|
|Publication status||Published - 2019|
- Low-energy ion scattering (LEIS)
- Surface analysis