Limit theorems for reflected Ornstein-Uhlenbeck processes

G. Huang, M.R.H. Mandjes, P.J.C. Spreij

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This paper studies one-dimensional Ornstein-Uhlenbeck processes, with the distinguishing feature that they are reflected on a single boundary (put at level 0) or two boundaries (put at levels 0 and d>0). In the literature they are referred to as reflected OU (ROU) and doubly-reflected OU (DROU) respectively. For both cases, we explicitly determine the decay rates of the (transient) probability to reach a given extreme level. The methodology relies on sample-path large deviations, so that we also identify the associated most likely paths. For DROU, we also consider the `idleness process' $L_t$ and the `loss process' $U_t$, which are the minimal nondecreasing processes which make the OU process remain $\geqslant 0$ and $\leqslant d$, respectively. We derive central limit theorems for $U_t$ and $L_t$, using techniques from stochastic integration and the martingale central limit theorem.
Original languageEnglish
Number of pages17
Publication statusPublished - 2013

Publication series
Volume1304.0332 [math.PR]


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