| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2nd Symposium on Design Methodology(PRORISC), April, 1990 |
| Pages | 89-98 |
| Publication status | Published - 1990 |
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Layout verification for fault and yield analysis
- J. Pineda de Gyvez
- , J.A.G. Jess
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review