Layout-driven SOC test architecture design for test time and wire length minimization

S.K. Goel, E.J. Marinissen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

31 Citations (Scopus)

Abstract

This paper extends existing SOC test architecture design approaches that minimize required tester vector memory depth and test application time, with the capability to minimize the wire length required by the test architecture. We present a simple, Yet effective wire length cost model for test architectures together with a new test architecture design algorithm that minimizes both test time and wire length. The user specifies the relative weight of the costs of test time versus wire length. In an integrated fashion, the algorithm partitions the total available TAM width over individual TAMs, assigns the modules to these TAMs, and orders the modules within one TAM such that the total cost is minimized. Experimental results on five benchmark SOCs show that we can ()brain savings of up to 86% in wiring costs at the expense of <4% in test time.
Original languageEnglish
Title of host publication2003 Design, Automation and Test in Europe Conference and Exhibition
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages738-743
ISBN (Print)0-7695-1870-2
DOIs
Publication statusPublished - 2003
Externally publishedYes
Event6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003) - Munich, Germany
Duration: 7 Mar 20037 Mar 2003

Conference

Conference6th Design, Automation and Test in Europe Conference and Exhibition (DATE 2003)
Abbreviated titleDATE'03
Country/TerritoryGermany
CityMunich
Period7/03/037/03/03
OtherDATE 2003, Munich, Germany

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