Abstract
In this chapter the layout procedure, layout challenges, and measurement setups for 60 GHz circuits designed in this work are explained. Millimeter-wave integrated circuits face additional difficulties in circuit design, layout, and measurement, as compared to their lower frequency counterparts. The parasitic effects are so much accentuated at these frequencies that the designer is required to shift repeatedly the focus from circuit-schematic level to layout and vice versa. In fact the mm-wave circuits may fail to operate correctly just as a result of layout problems. For instance inappropriate interconnect sizing in the layout of a mm-wave voltage-controlled oscillator (VCO) can cause failure of oscillation.
| Original language | English |
|---|---|
| Title of host publication | RF-Frontend Design for Process-Variation-Tolerant Receivers |
| Publisher | Springer |
| Chapter | 3 |
| Pages | 39-59 |
| Number of pages | 21 |
| ISBN (Electronic) | 978-1-4614-2122-1 |
| ISBN (Print) | 978-1-4614-2121-4, 978-1-4939-0223-1 |
| DOIs | |
| Publication status | Published - 2012 |
Publication series
| Name | Analog Circuits and Signal Processing |
|---|---|
| ISSN (Print) | 1872-082X |
| ISSN (Electronic) | 2197-1854 |
Bibliographical note
Publisher Copyright:© 2012, Springer Science+Business Media New York.
Keywords
- Device Under Test
- Differential Circuit
- Phase Noise Measurement
- Signal Line
- Transmission Line
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