Large-Scale H2 Optimization for Thermo-Mechanical Reliability of Electronics

Pascal den Boef; Jos Maubach; Wil Schilders; Nathan van de Wouw

doi:10.1007/978-3-031-54517-7_16

Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics

Pascal den Boef, Jos Maubach, Wil Schilders, Nathan van de Wouw

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

Optimization of transient models is required in several domains related to thermo-mechanical reliability of electronics, such as Prognostic Health Monitoring (PHM) and design optimization. A novel framework for efficient (local) parameter optimization of transient models in the H₂ norm is proposed. The optimization is feasible for large-scale transient models because it approximates the gradient using physics-based model order reduction (MOR), in contrast to existing approaches that typically use data-driven surrogate models such as neural networks. To demonstrate the framework an optimal fixed-order virtual sensor for PHM of a Ball Grid Array (BGA) is numerically determined.

Original language	English
Title of host publication	Scientific Computing in Electrical Engineering
Subtitle of host publication	SCEE 2022, Amsterdam, The Netherlands, July 2022
Editors	Martijn van Beurden, Neil V. Budko, Gabriela Ciuprina, Wil Schilders, Harshit Bansal, Ruxandra Barbulescu
Place of Publication	Cham
Publisher	Springer
Pages	144-151
Number of pages	8
ISBN (Electronic)	978-3-031-54517-7
ISBN (Print)	978-3-031-54516-0
DOIs	https://doi.org/10.1007/978-3-031-54517-7_16
Publication status	Published - 1 Mar 2024
Event	Scientific Computing in Electrical Engineering, SCEE 2022 - Amsterdam, Netherlands Duration: 11 Jul 2022 → 14 Jul 2022 https://www.scee-conferences.org/

Publication series

Name	Mathematics in Industry
Volume	43
ISSN (Print)	1612-3956
ISSN (Electronic)	2198-3283

Conference

Conference	Scientific Computing in Electrical Engineering, SCEE 2022
Abbreviated title	SCEE 2022
Country/Territory	Netherlands
City	Amsterdam
Period	11/07/22 → 14/07/22
Internet address	https://www.scee-conferences.org/

Access to Document

10.1007/978-3-031-54517-7_16

pdfFinal published version, 219 KBLicence: TAVERNE

Cite this

den Boef, P., Maubach, J., Schilders, W., & van de Wouw, N. (2024). Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. In M. van Beurden, N. V. Budko, G. Ciuprina, W. Schilders, H. Bansal, & R. Barbulescu (Eds.), Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022 (pp. 144-151). (Mathematics in Industry; Vol. 43). Springer. https://doi.org/10.1007/978-3-031-54517-7_16

den Boef, Pascal ; Maubach, Jos ; Schilders, Wil et al. / Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. editor / Martijn van Beurden ; Neil V. Budko ; Gabriela Ciuprina ; Wil Schilders ; Harshit Bansal ; Ruxandra Barbulescu. Cham : Springer, 2024. pp. 144-151 (Mathematics in Industry).

@inproceedings{77d959aeec1e4c80b91019b54bc12291,

title = "Large-Scale H2 Optimization for Thermo-Mechanical Reliability of Electronics",

abstract = "Optimization of transient models is required in several domains related to thermo-mechanical reliability of electronics, such as Prognostic Health Monitoring (PHM) and design optimization. A novel framework for efficient (local) parameter optimization of transient models in the H2 norm is proposed. The optimization is feasible for large-scale transient models because it approximates the gradient using physics-based model order reduction (MOR), in contrast to existing approaches that typically use data-driven surrogate models such as neural networks. To demonstrate the framework an optimal fixed-order virtual sensor for PHM of a Ball Grid Array (BGA) is numerically determined.",

author = "{den Boef}, Pascal and Jos Maubach and Wil Schilders and {van de Wouw}, Nathan",

year = "2024",

month = mar,

day = "1",

doi = "10.1007/978-3-031-54517-7_16",

language = "English",

isbn = "978-3-031-54516-0",

series = "Mathematics in Industry",

publisher = "Springer",

pages = "144--151",

editor = "{van Beurden}, Martijn and Budko, {Neil V.} and Gabriela Ciuprina and Wil Schilders and Harshit Bansal and Ruxandra Barbulescu",

booktitle = "Scientific Computing in Electrical Engineering",

address = "Germany",

note = "Scientific Computing in Electrical Engineering, SCEE 2022, SCEE 2022 ; Conference date: 11-07-2022 Through 14-07-2022",

url = "https://www.scee-conferences.org/",

}

den Boef, P , Maubach, J , Schilders, W & van de Wouw, N 2024, Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. in M van Beurden, NV Budko, G Ciuprina, W Schilders, H Bansal & R Barbulescu (eds), Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. Mathematics in Industry, vol. 43, Springer, Cham, pp. 144-151, Scientific Computing in Electrical Engineering, SCEE 2022, Amsterdam, Netherlands, 11/07/22. https://doi.org/10.1007/978-3-031-54517-7_16

Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. / den Boef, Pascal ; Maubach, Jos ; Schilders, Wil et al.
Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. ed. / Martijn van Beurden; Neil V. Budko; Gabriela Ciuprina; Wil Schilders; Harshit Bansal; Ruxandra Barbulescu. Cham: Springer, 2024. p. 144-151 (Mathematics in Industry; Vol. 43).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Large-Scale H2 Optimization for Thermo-Mechanical Reliability of Electronics

AU - den Boef, Pascal

AU - Maubach, Jos

AU - Schilders, Wil

AU - van de Wouw, Nathan

PY - 2024/3/1

Y1 - 2024/3/1

N2 - Optimization of transient models is required in several domains related to thermo-mechanical reliability of electronics, such as Prognostic Health Monitoring (PHM) and design optimization. A novel framework for efficient (local) parameter optimization of transient models in the H2 norm is proposed. The optimization is feasible for large-scale transient models because it approximates the gradient using physics-based model order reduction (MOR), in contrast to existing approaches that typically use data-driven surrogate models such as neural networks. To demonstrate the framework an optimal fixed-order virtual sensor for PHM of a Ball Grid Array (BGA) is numerically determined.

AB - Optimization of transient models is required in several domains related to thermo-mechanical reliability of electronics, such as Prognostic Health Monitoring (PHM) and design optimization. A novel framework for efficient (local) parameter optimization of transient models in the H2 norm is proposed. The optimization is feasible for large-scale transient models because it approximates the gradient using physics-based model order reduction (MOR), in contrast to existing approaches that typically use data-driven surrogate models such as neural networks. To demonstrate the framework an optimal fixed-order virtual sensor for PHM of a Ball Grid Array (BGA) is numerically determined.

UR - http://www.scopus.com/inward/record.url?scp=85188096752&partnerID=8YFLogxK

U2 - 10.1007/978-3-031-54517-7_16

DO - 10.1007/978-3-031-54517-7_16

M3 - Conference contribution

AN - SCOPUS:85188096752

SN - 978-3-031-54516-0

T3 - Mathematics in Industry

SP - 144

EP - 151

BT - Scientific Computing in Electrical Engineering

A2 - van Beurden, Martijn

A2 - Budko, Neil V.

A2 - Ciuprina, Gabriela

A2 - Schilders, Wil

A2 - Bansal, Harshit

A2 - Barbulescu, Ruxandra

PB - Springer

CY - Cham

T2 - Scientific Computing in Electrical Engineering, SCEE 2022

Y2 - 11 July 2022 through 14 July 2022

ER -

den Boef P , Maubach J , Schilders W , van de Wouw N. Large-Scale H₂ Optimization for Thermo-Mechanical Reliability of Electronics. In van Beurden M, Budko NV, Ciuprina G, Schilders W, Bansal H, Barbulescu R, editors, Scientific Computing in Electrical Engineering: SCEE 2022, Amsterdam, The Netherlands, July 2022. Cham: Springer. 2024. p. 144-151. (Mathematics in Industry). doi: 10.1007/978-3-031-54517-7_16