Large memory effect in oxidic thin-film transistors with a ferroelectric insulator

M.W.J. Prins, J.F.M. Cillessen, J.B. Giesbers, K.-O. Grosse-Holz

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationAnnual Device Research Conference Digest
Pages76-77
Publication statusPublished - 1996

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