Kwaliteitscontrole diagnostische monitoren

E. Alphen, van, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Design and Technology of Instrumentation (DTI)

    Research output: ThesisPd Eng Thesis

    Original languageDutch
    QualificationDoctor of Philosophy
    Awarding Institution
    Supervisors/Advisors
    • Kopinga, Klaas, Supervisor
    • Asten, van, W.N.J.C., External supervisor, External person
    Award date1 Jan 2003
    Place of PublicationEindhoven
    Publisher
    Print ISBNs90-444-0292-7
    Publication statusPublished - 2003

    Bibliographical note

    Eindverslag

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