Josephson radiation and shot noise of a semiconductor nanowire junction

D. J. van Woerkom, A. Proutski, R.J.J. Van Gulik, T. Kriváchy, D. Car, S.R. Plissard, E.P.A.M. Bakkers, L.P. Kouwenhoven, A. Geresdi

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Abstract

We measured the Josephson radiation emitted by an InSb semiconductor nanowire junction utilizing photon-assisted quasiparticle tunneling in an ac-coupled superconducting tunnel junction. We quantify the action of the local microwave environment by evaluating the frequency dependence of the inelastic Cooper-pair tunneling of the nanowire junction and find the zero-frequency impedance Z(0)=492Ω with a cutoff frequency of f0=33.1GHz. We extract a circuit coupling efficiency of η≈0.1 and a detector quantum efficiency approaching unity in the high-frequency limit. In addition to the Josephson radiation, we identify a shot noise contribution with a Fano factor F≈1, consistently with the presence of single electron states in the nanowire channel.

Original languageEnglish
Article number094508
Number of pages5
JournalPhysical Review B
Volume96
Issue number9
DOIs
Publication statusPublished - 11 Sept 2017

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