Iterative test-point selection for analog circuits

J. Spaandonk, van, T.A.M. Kevenaar

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

23 Citations (Scopus)
Original languageEnglish
Title of host publicationProc. IEEE/VLSI Test Symp.
Pages66-70
Publication statusPublished - 1996
Eventconference; Proc. IEEE/VLSI Test Symp. -
Duration: 1 Jan 1996 → …

Conference

Conferenceconference; Proc. IEEE/VLSI Test Symp.
Period1/01/96 → …
OtherProc. IEEE/VLSI Test Symp.

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