| Original language | English |
|---|---|
| Title of host publication | Proc. IEEE/VLSI Test Symp. |
| Pages | 66-70 |
| Publication status | Published - 1996 |
| Event | conference; Proc. IEEE/VLSI Test Symp. - Duration: 1 Jan 1996 → … |
Conference
| Conference | conference; Proc. IEEE/VLSI Test Symp. |
|---|---|
| Period | 1/01/96 → … |
| Other | Proc. IEEE/VLSI Test Symp. |