Abstract
Over the last decade there has been a surge of activity in employing advanced statistical analysis and machine learning methods to various test-related tasks. The topic is no longer simply a matter of academic curiosity but, rather, a pressing need of the industry as it seeks to address various challenges. In this session, three industry experts have been invited to give their perspective, describe machine learning use cases, and discuss challenges and future work ideas. The three talks will cover the use of deep learning for hotspot detection, the challenge of rendering machine learning-based decisions in the semiconductor industry trustable and explainable, and data analytics across the the complete product cycle towards improved product reliability.
Original language | English |
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Title of host publication | 2019 IEEE 37th VLSI Test Symposium, VTS 2019 |
Publisher | IEEE Computer Society |
Number of pages | 1 |
ISBN (Electronic) | 9781728111704 |
DOIs | |
Publication status | Published - Apr 2019 |
Event | 37th IEEE VLSI Test Symposium, VTS 2019 - Monterey, United States Duration: 23 Apr 2019 → 25 Apr 2019 |
Conference
Conference | 37th IEEE VLSI Test Symposium, VTS 2019 |
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Country/Territory | United States |
City | Monterey |
Period | 23/04/19 → 25/04/19 |