Ion scattering: a spectroscopic tool for study of the outermost atomic layer of a solid surface

  • H. H. Brongersma
  • , P. M. Mul

Research output: Contribution to journalArticleAcademicpeer-review

66 Citations (Scopus)

Abstract

Noble gas ions which are back-scattered from crystal surface lose a specific amount of energy for surface atoms of a specific mass. The chemical reaction of a silicon (III) crystal surface with bromine has been followed using He+ and Ne+ ion scattering. It is shown that this technique can be used to study the first atomic layer of a surface selectively. Methods using ion scattering to study vibrations of surface atoms are also indicated.

Original languageEnglish
Pages (from-to)380-384
Number of pages5
JournalChemical Physics Letters
Volume14
Issue number3
DOIs
Publication statusPublished - 1 Jun 1972

Bibliographical note

Copyright:
Copyright 2014 Elsevier B.V., All rights reserved.

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