Ion-radical synergy in HfO2 etching studied in a beam experiment

P.M. Gevers, H.C.W. Beijerinck, M.C.M. Sanden, van de, W.M.M. Kessels

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

51 Downloads (Pure)

Abstract

Abstract only.
Original languageEnglish
Title of host publicationAVS 53rd International Symposium, Moscone West, San Francisco, CA, USA, November 12-17, 2006
Publication statusPublished - 2006
Event53rd International Symposium of the American Vacuum Society - San Francisco, United States
Duration: 12 Nov 200617 Nov 2006

Conference

Conference53rd International Symposium of the American Vacuum Society
Abbreviated titleAVS 53
Country/TerritoryUnited States
CitySan Francisco
Period12/11/0617/11/06

Fingerprint

Dive into the research topics of 'Ion-radical synergy in HfO2 etching studied in a beam experiment'. Together they form a unique fingerprint.

Cite this