Investigations of the disturbed layer of ground quartz

G.D. Rieck, K. Koopmans

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)


It is shown electron microscopically that in 3 μm diameter wet ground quartz powders less than 1% of the mass consists of sub-microscopical 'adhering' particles. The observed decrease in the peak intensities of the X-ray diffraction lines of these 3 μm powders must be attributed to disturbed outer layers of the powder particles. It is shown that the outer layers recover to a considerable extent by a heat treatment at 1200°C and the X-ray and electron diffraction diagrams reveal that the disturbance is rather slight. From the profiles of the X-ray powder lines it can be derived that the thickness of the disturbed layer in these powders is greater than or equal to 0.4 μm.

Original languageEnglish
Article number311
Pages (from-to)419-425
Number of pages7
JournalBritish Journal of Applied Physics
Issue number4
Publication statusPublished - 1 Dec 1964


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