Investigations in applying metrics to multi-view architecture models

J. Muskens, C.F.J. Lange, M.R.V. Chaudron

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 30th Euromicro Conference (Euromicro'04, Rennes, France, August 31-September 3, 2004)
EditorsR. Steinmetz, A. Mauthe
Place of PublicationLos Alamitos CA, USA
PublisherIEEE Computer Society
ISBN (Print)0-7695-2199-1
Publication statusPublished - 2004

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