Abstract
A technique to measure a terahertz wave generated by spectrum tailored
Fabry-Pérot lasers (FP) is assessed. A dc-biased and 25 °C
temperature controlled FP is probed by a continuous wave signal, tuned
at 20 nm away from its lasing modes. With a 0.02 nm resolution optical
spectrum analyzer (OSA), the terahertz generated signal frequency is
measured from the interval between the probe and its side-band
modulations. The terahertz waves emitted by these FPs are measured at
370±5 GHz and at 1.157±0.005 THz, respectively, within a
precision set by our OSA. The origin of the terahertz wave is due to
passive mode-locked through intracavity four-wave-mixing processes.
Original language | English |
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Pages (from-to) | 241110 |
Journal | Applied Physics Letters |
Volume | 93 |
Issue number | 24 |
DOIs | |
Publication status | Published - 1 Dec 2008 |
Externally published | Yes |
Keywords
- Radiowave and microwave technology
- Semiconductor lasers
- laser diodes
- Modulation tuning and mode locking
- Phase conjugation
- photorefractive and Kerr effects