Investigation of the shift of Raman modes of graphene flakes

M. Haluska; D. Obergfell; J.C. Meyer; G. Scalia; G. Ulbricht; B. Krauss; D.H. Chae; T. Lohmann; M. Lebert; M. Kaempgen; M. Hulman; J. Smet; S. Roth; K. von Klitzing

doi:10.1002/pssb.200776202

Investigation of the shift of Raman modes of graphene flakes

M. Haluska, D. Obergfell, J.C. Meyer, G. Scalia, G. Ulbricht, B. Krauss, D.H. Chae, T. Lohmann, M. Lebert, M. Kaempgen, M. Hulman, J. Smet, S. Roth, K. von Klitzing

Energy Technology

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

In the present work, we use Raman spectroscopy as sensitive tool for the characterization of graphene samples. We observed diverse shifts in the position of the Raman mode close to 2650 cm–1 in various as-prepared graphene flakes. In order to elucidate the reason for this variation, we checked different substrates (Si/SiO2 and Si/Al2O3) and the effect of the annealing of graphene in argon. We find that most of as-prepared graphene flakes were non-intentional doped by holes, i.e. by physisorbed water and/or oxygen.

Original language	English
Pages (from-to)	4143-4146
Journal	Physica Status Solidi B
Volume	244
Issue number	11
DOIs	https://doi.org/10.1002/pssb.200776202
Publication status	Published - 2007

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title = "Investigation of the shift of Raman modes of graphene flakes",

abstract = "In the present work, we use Raman spectroscopy as sensitive tool for the characterization of graphene samples. We observed diverse shifts in the position of the Raman mode close to 2650 cm–1 in various as-prepared graphene flakes. In order to elucidate the reason for this variation, we checked different substrates (Si/SiO2 and Si/Al2O3) and the effect of the annealing of graphene in argon. We find that most of as-prepared graphene flakes were non-intentional doped by holes, i.e. by physisorbed water and/or oxygen.",

author = "M. Haluska and D. Obergfell and J.C. Meyer and G. Scalia and G. Ulbricht and B. Krauss and D.H. Chae and T. Lohmann and M. Lebert and M. Kaempgen and M. Hulman and J. Smet and S. Roth and {von Klitzing}, K.",

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doi = "10.1002/pssb.200776202",

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pages = "4143--4146",

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T1 - Investigation of the shift of Raman modes of graphene flakes

AU - Haluska, M.

AU - Obergfell, D.

AU - Meyer, J.C.

AU - Scalia, G.

AU - Ulbricht, G.

AU - Krauss, B.

AU - Chae, D.H.

AU - Lohmann, T.

AU - Lebert, M.

AU - Kaempgen, M.

AU - Hulman, M.

AU - Smet, J.

AU - Roth, S.

AU - von Klitzing, K.

PY - 2007

Y1 - 2007

N2 - In the present work, we use Raman spectroscopy as sensitive tool for the characterization of graphene samples. We observed diverse shifts in the position of the Raman mode close to 2650 cm–1 in various as-prepared graphene flakes. In order to elucidate the reason for this variation, we checked different substrates (Si/SiO2 and Si/Al2O3) and the effect of the annealing of graphene in argon. We find that most of as-prepared graphene flakes were non-intentional doped by holes, i.e. by physisorbed water and/or oxygen.

AB - In the present work, we use Raman spectroscopy as sensitive tool for the characterization of graphene samples. We observed diverse shifts in the position of the Raman mode close to 2650 cm–1 in various as-prepared graphene flakes. In order to elucidate the reason for this variation, we checked different substrates (Si/SiO2 and Si/Al2O3) and the effect of the annealing of graphene in argon. We find that most of as-prepared graphene flakes were non-intentional doped by holes, i.e. by physisorbed water and/or oxygen.

U2 - 10.1002/pssb.200776202

DO - 10.1002/pssb.200776202

M3 - Article

SN - 0370-1972

VL - 244

SP - 4143

EP - 4146

JO - Physica Status Solidi B

JF - Physica Status Solidi B

IS - 11

ER -

Investigation of the shift of Raman modes of graphene flakes

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