Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

D. Konstantinou; C. Caillaud; S. Rommel; U. Johannsen; I. Tafur Monroy

doi:10.23919/EuMC48046.2021.9338063

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

D. Konstantinou, C. Caillaud, S. Rommel, U. Johannsen, I. Tafur Monroy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

247 Downloads (Pure)

Abstract

This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

Original language	English
Title of host publication	2020 50th European Microwave Conference, EuMC 2020
Publisher	Institute of Electrical and Electronics Engineers
Pages	320-323
Number of pages	4
ISBN (Electronic)	9782874870590
DOIs	https://doi.org/10.23919/EuMC48046.2021.9338063
Publication status	Published - 2 Feb 2021
Event	50th European Microwave Conference (EuMC 2020) - Utrecht, Netherlands, Utrecht, Netherlands Duration: 12 Jan 2021 → 14 Jan 2021 Conference number: 50

Conference

Conference	50th European Microwave Conference (EuMC 2020)
Abbreviated title	EuMC 2020
Country/Territory	Netherlands
City	Utrecht
Period	12/01/21 → 14/01/21
Other	Held as Part of the European Microwave Week, EuMW 2020 10-15 January, 2021 Utrecht

Funding

ACKNOWLEDGMENT This work was partially funded by the 5G STEP FWD, 5G-PHOS and blueSPACE projects with funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement numbers 722429, 761989, and 762055, respectively.

Funders	Funder number
European Union's Horizon 2020 - Research and Innovation Framework Programme	761989, 722429, 762055

Keywords

UTC-PDs
de-embedding
microwave photonics

Access to Document

10.23919/EuMC48046.2021.9338063

eumc_authors_versionFinal author version , 651 KB

Cite this

@inproceedings{cd253c1b800145a38960f6bdba4ca15b,

title = "Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes",

abstract = "This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.",

keywords = "UTC-PDs, de-embedding, microwave photonics",

author = "D. Konstantinou and C. Caillaud and S. Rommel and U. Johannsen and Monroy, \{I. Tafur\}",

year = "2021",

month = feb,

day = "2",

doi = "10.23919/EuMC48046.2021.9338063",

language = "English",

pages = "320--323",

booktitle = "2020 50th European Microwave Conference, EuMC 2020",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "50th European Microwave Conference (EuMC 2020), EuMC 2020 ; Conference date: 12-01-2021 Through 14-01-2021",

}

Konstantinou, D, Caillaud, C, Rommel, S , Johannsen, U & Monroy, IT 2021, Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes. in 2020 50th European Microwave Conference, EuMC 2020., 9338063, Institute of Electrical and Electronics Engineers, pp. 320-323, 50th European Microwave Conference (EuMC 2020), Utrecht, Netherlands, 12/01/21. https://doi.org/10.23919/EuMC48046.2021.9338063

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes. / Konstantinou, D.; Caillaud, C.; Rommel, S. et al.
2020 50th European Microwave Conference, EuMC 2020. Institute of Electrical and Electronics Engineers, 2021. p. 320-323 9338063.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

AU - Konstantinou, D.

AU - Caillaud, C.

AU - Rommel, S.

AU - Johannsen, U.

AU - Monroy, I. Tafur

N1 - Conference code: 50

PY - 2021/2/2

Y1 - 2021/2/2

N2 - This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

AB - This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

KW - UTC-PDs

KW - de-embedding

KW - microwave photonics

UR - http://www.scopus.com/inward/record.url?scp=85100936625&partnerID=8YFLogxK

U2 - 10.23919/EuMC48046.2021.9338063

DO - 10.23919/EuMC48046.2021.9338063

M3 - Conference contribution

SP - 320

EP - 323

BT - 2020 50th European Microwave Conference, EuMC 2020

PB - Institute of Electrical and Electronics Engineers

T2 - 50th European Microwave Conference (EuMC 2020)

Y2 - 12 January 2021 through 14 January 2021

ER -

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

Abstract

Conference

Funding

Keywords

Access to Document

Other files and links

Fingerprint

5G-PHOS: 5G integrated Fiber-Wireless networks exploiting existing photonic technologies for high-density SDN-programmable network architectures

5G STEP FWD

blueSPACE

Cite this

Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

Abstract

Conference

Funding

Keywords

Access to Document

Other files and links

Fingerprint

Projects

5G-PHOS: 5G integrated Fiber-Wireless networks exploiting existing photonic technologies for high-density SDN-programmable network architectures

5G STEP FWD

blueSPACE

Cite this