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This work reviews and investigates two de-embedding methods contributing to the characterization of the active region within uni-traveling carrier photodiodes. De-embedding techniques remove the parasitic effects of the waveguides connected to the active area of these devices allowing the calculation of their series resistance and junction capacitance. The Open-Short method is examined where a systematic error introduced by the technique is identified. This error is analytically extracted and a correction is implemented. The properties of an S-Parameter based de-embedding are also analyzed through simulation approaches. The lumped components calculated and verified by these processes are compared for diodes with different sizes.

Original languageEnglish
Title of host publication2020 50th European Microwave Conference, EuMC 2020
PublisherInstitute of Electrical and Electronics Engineers
Number of pages4
ISBN (Electronic)9782874870590
Publication statusPublished - 2 Feb 2021
Event50th European Microwave Conference (EuMC 2020) - Utrecht, Netherlands, Utrecht, Netherlands
Duration: 12 Jan 202114 Jan 2021
Conference number: 50


Conference50th European Microwave Conference (EuMC 2020)
Abbreviated titleEuMC 2020
OtherHeld as Part of the European Microwave Week, EuMW 2020 10-15 January, 2021 Utrecht


ACKNOWLEDGMENT This work was partially funded by the 5G STEP FWD, 5G-PHOS and blueSPACE projects with funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement numbers 722429, 761989, and 762055, respectively.

FundersFunder number
European Union 's Horizon 2020 - Research and Innovation Framework Programme761989, 722429, 762055


    • UTC-PDs
    • de-embedding
    • microwave photonics


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