Intra-die leakage current behavior of digital CMOS circuits: a threshold voltage mismatch perspective,

Research output: Book/Report › Report › Academic

Original language	English
Place of Publication	Eindhoven
Publisher	Philips Research Laboratories
Publication status	Published - 2002

Name	NatLab Technical Note
Volume	058

Cite this

@book{f12f8e2a34b24d649a7bb2a164e7e804,

title = "Intra-die leakage current behavior of digital CMOS circuits: a threshold voltage mismatch perspective,",

author = "\{Pineda de Gyvez\}, J. and H. Tuinhout",

year = "2002",

language = "English",

series = "NatLab Technical Note",

publisher = "Philips Research Laboratories",

address = "Netherlands",

}

TY - BOOK

T1 - Intra-die leakage current behavior of digital CMOS circuits: a threshold voltage mismatch perspective,

AU - Pineda de Gyvez, J.

AU - Tuinhout, H.

PY - 2002

Y1 - 2002

M3 - Report

T3 - NatLab Technical Note

BT - Intra-die leakage current behavior of digital CMOS circuits: a threshold voltage mismatch perspective,

PB - Philips Research Laboratories

CY - Eindhoven

ER -