Integration of physical reliability knowledge into the design of VLSI circuits

D.C.L. Geest, van, R.H. Hoeksma, A.C. Brombacher, O. Herrmann

Research output: Contribution to conferenceOtherAcademic

Original languageEnglish
Publication statusPublished - 1993

Cite this

@conference{ffe886a2271c4c1ca24a832ff7b9f23f,
title = "Integration of physical reliability knowledge into the design of VLSI circuits",
author = "{Geest, van}, D.C.L. and R.H. Hoeksma and A.C. Brombacher and O. Herrmann",
year = "1993",
language = "English",

}

Integration of physical reliability knowledge into the design of VLSI circuits. / Geest, van, D.C.L.; Hoeksma, R.H.; Brombacher, A.C.; Herrmann, O.

1993.

Research output: Contribution to conferenceOtherAcademic

TY - CONF

T1 - Integration of physical reliability knowledge into the design of VLSI circuits

AU - Geest, van, D.C.L.

AU - Hoeksma, R.H.

AU - Brombacher, A.C.

AU - Herrmann, O.

PY - 1993

Y1 - 1993

M3 - Other

ER -