| Original language | English |
|---|---|
| Publication status | Published - 1993 |
Cite this
Geest, van, D. C. L., Hoeksma, R. H., Brombacher, A. C., & Herrmann, O. (1993). Integration of physical reliability knowledge into the design of VLSI circuits.
@conference{ffe886a2271c4c1ca24a832ff7b9f23f,
title = "Integration of physical reliability knowledge into the design of VLSI circuits",
author = "{Geest, van}, D.C.L. and R.H. Hoeksma and A.C. Brombacher and O. Herrmann",
year = "1993",
language = "English",
}
Geest, van, DCL, Hoeksma, RH, Brombacher, AC & Herrmann, O 1993, 'Integration of physical reliability knowledge into the design of VLSI circuits'.
Integration of physical reliability knowledge into the design of VLSI circuits. / Geest, van, D.C.L.; Hoeksma, R.H.; Brombacher, A.C.; Herrmann, O.
1993.Research output: Contribution to conference › Other
TY - CONF
T1 - Integration of physical reliability knowledge into the design of VLSI circuits
AU - Geest, van, D.C.L.
AU - Hoeksma, R.H.
AU - Brombacher, A.C.
AU - Herrmann, O.
PY - 1993
Y1 - 1993
M3 - Other
ER -
Geest, van DCL, Hoeksma RH, Brombacher AC, Herrmann O. Integration of physical reliability knowledge into the design of VLSI circuits. 1993.