Integration and test strategies for semiconductor manufacturing equipment

I. S M De Jong; R. Boumen; J. M. van de Mortel-Fronczak; J. E. Rooda

Integration and test strategies for semiconductor manufacturing equipment

I. S M De Jong
, R. Boumen
, J. M. van de Mortel-Fronczak
, J. E. Rooda

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However, methods to design and evaluate integration and test strategies for multi-disciplinary systems are hardly available. In this paper, we present a method to design and compare integration and test strategies. Following this method, an optimal integration and test strategy can be chosen from a set of possible strategies. A case has been performed where a system is integrated and tested using three different integration and test strategies: a time-to-market-driven strategy, a qualitydriven strategy and a combined quality and time-to-market strategy.

Original language	English
Title of host publication	16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006
Place of Publication	Red Hook, New York
Publisher	Curran Associates
Pages	270-284
Number of pages	15
ISBN (Print)	978-1-62276-929-2
Publication status	Published - 1 Dec 2006
Event	16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006: Shining Light on the Tough Issues - Orlando, United States Duration: 10 Jul 2006 → 13 Jul 2006 Conference number: 16

Conference

Conference	16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006
Abbreviated title	INCOSE 2006
Country/Territory	United States
City	Orlando
Period	10/07/06 → 13/07/06

Cite this

@inproceedings{a5a549402a384d4cab8f94dd471a1d6d,

title = "Integration and test strategies for semiconductor manufacturing equipment",

abstract = "The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However, methods to design and evaluate integration and test strategies for multi-disciplinary systems are hardly available. In this paper, we present a method to design and compare integration and test strategies. Following this method, an optimal integration and test strategy can be chosen from a set of possible strategies. A case has been performed where a system is integrated and tested using three different integration and test strategies: a time-to-market-driven strategy, a qualitydriven strategy and a combined quality and time-to-market strategy.",

author = "\{De Jong\}, \{I. S M\} and R. Boumen and \{van de Mortel-Fronczak\}, \{J. M.\} and Rooda, \{J. E.\}",

year = "2006",

month = dec,

day = "1",

language = "English",

isbn = "978-1-62276-929-2",

pages = "270--284",

booktitle = "16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006",

publisher = "Curran Associates",

note = "16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006 : Shining Light on the Tough Issues, INCOSE 2006 ; Conference date: 10-07-2006 Through 13-07-2006",

}

De Jong, ISM, Boumen, R, van de Mortel-Fronczak, JM & Rooda, JE 2006, Integration and test strategies for semiconductor manufacturing equipment. in 16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006. Curran Associates, Red Hook, New York, pp. 270-284, 16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006, Orlando, Florida, United States, 10/07/06.

Integration and test strategies for semiconductor manufacturing equipment. / De Jong, I. S M; Boumen, R.; van de Mortel-Fronczak, J. M. et al.
16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006. Red Hook, New York: Curran Associates, 2006. p. 270-284.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Integration and test strategies for semiconductor manufacturing equipment

AU - De Jong, I. S M

AU - Boumen, R.

AU - van de Mortel-Fronczak, J. M.

AU - Rooda, J. E.

N1 - Conference code: 16

PY - 2006/12/1

Y1 - 2006/12/1

N2 - The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However, methods to design and evaluate integration and test strategies for multi-disciplinary systems are hardly available. In this paper, we present a method to design and compare integration and test strategies. Following this method, an optimal integration and test strategy can be chosen from a set of possible strategies. A case has been performed where a system is integrated and tested using three different integration and test strategies: a time-to-market-driven strategy, a qualitydriven strategy and a combined quality and time-to-market strategy.

AB - The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However, methods to design and evaluate integration and test strategies for multi-disciplinary systems are hardly available. In this paper, we present a method to design and compare integration and test strategies. Following this method, an optimal integration and test strategy can be chosen from a set of possible strategies. A case has been performed where a system is integrated and tested using three different integration and test strategies: a time-to-market-driven strategy, a qualitydriven strategy and a combined quality and time-to-market strategy.

UR - https://www.scopus.com/pages/publications/84878794510

M3 - Conference contribution

AN - SCOPUS:84878794510

SN - 978-1-62276-929-2

SP - 270

EP - 284

BT - 16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006

PB - Curran Associates

CY - Red Hook, New York

T2 - 16th Annual International Symposium of the International Council on Systems Engineering, INCOSE 2006

Y2 - 10 July 2006 through 13 July 2006

ER -

Integration and test strategies for semiconductor manufacturing equipment

Abstract

Conference

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