TY - JOUR
T1 - Integration and test sequencing for complex systems
AU - Boumen, R.
AU - Jong, de, I.S.M.
AU - Mestrom, J.M.G.
AU - Mortel - Fronczak, van de, J.M.
AU - Rooda, J.E.
PY - 2009
Y1 - 2009
N2 - The integration and test phase of complex manufacturing machines, like an ASML lithographic manufacturing system, is expensive and time consuming. The tests that can be performed at a certain point in time during the integration phase depend on the modules that are integrated and, therefore, on the preceding integration sequence. In this paper, we introduce a mathematical model to describe an overall integration and test sequencing problem, and we propose an algorithm to solve this problem. The method is a combination of integration sequencing and test sequencing. Furthermore, we introduce several strategies that determine when test phases should start. With a case study within the development of a software release that is used to control an ASML lithographic machine, we show that the described method and strategies can be used to solve real-life problems.
AB - The integration and test phase of complex manufacturing machines, like an ASML lithographic manufacturing system, is expensive and time consuming. The tests that can be performed at a certain point in time during the integration phase depend on the modules that are integrated and, therefore, on the preceding integration sequence. In this paper, we introduce a mathematical model to describe an overall integration and test sequencing problem, and we propose an algorithm to solve this problem. The method is a combination of integration sequencing and test sequencing. Furthermore, we introduce several strategies that determine when test phases should start. With a case study within the development of a software release that is used to control an ASML lithographic machine, we show that the described method and strategies can be used to solve real-life problems.
U2 - 10.1109/TSMCA.2008.2006374
DO - 10.1109/TSMCA.2008.2006374
M3 - Article
SN - 1083-4427
VL - 39
SP - 177
EP - 187
JO - IEEE Transactions on Systems, Man and Cybernetics. Part A, Systems and Humans
JF - IEEE Transactions on Systems, Man and Cybernetics. Part A, Systems and Humans
IS - 1
ER -