Abstract
Planning an integration and test phase is often done by experts in the visited organizations. These experts have a thorough knowledge about the system, integration and testing and the business drivers of an organization. An integration and test plan developedfor an airplane is different than the integration and test plan for a wafer scanner. Safety (quality) is most important for an airplane, while time-to-market is most important for a wafer scanner. These important aspects are reflected in the integration and test plan. A number of companies has been visited to investigate the influence of the business drivers on the resulting integration and test plans.
| Original language | English |
|---|---|
| Title of host publication | Tangram: Model-based integration and testing of complex high-tech systems |
| Editors | J. Tretmans |
| Place of Publication | Eindhoven |
| Publisher | Embedded Systems Institute |
| Pages | 31-44 |
| ISBN (Print) | 978-90-78679-02-8 |
| Publication status | Published - 2007 |