Integration and test planning patterns in different organizations

I.S.M. Jong, de, R. Boumen, J.M. Mortel - Fronczak, van de, J.E. Rooda

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

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Abstract

Planning an integration and test phase is often done by experts in the visited organizations. These experts have a thorough knowledge about the system, integration and testing and the business drivers of an organization. An integration and test plan developedfor an airplane is different than the integration and test plan for a wafer scanner. Safety (quality) is most important for an airplane, while time-to-market is most important for a wafer scanner. These important aspects are reflected in the integration and test plan. A number of companies has been visited to investigate the influence of the business drivers on the resulting integration and test plans.
Original languageEnglish
Title of host publicationTangram: Model-based integration and testing of complex high-tech systems
EditorsJ. Tretmans
Place of PublicationEindhoven
PublisherEmbedded Systems Institute
Pages31-44
ISBN (Print)978-90-78679-02-8
Publication statusPublished - 2007

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Planning
Safety
System integration
Testing
Time to market

Cite this

Jong, de, I. S. M., Boumen, R., Mortel - Fronczak, van de, J. M., & Rooda, J. E. (2007). Integration and test planning patterns in different organizations. In J. Tretmans (Ed.), Tangram: Model-based integration and testing of complex high-tech systems (pp. 31-44). Eindhoven: Embedded Systems Institute.
Jong, de, I.S.M. ; Boumen, R. ; Mortel - Fronczak, van de, J.M. ; Rooda, J.E. / Integration and test planning patterns in different organizations. Tangram: Model-based integration and testing of complex high-tech systems. editor / J. Tretmans. Eindhoven : Embedded Systems Institute, 2007. pp. 31-44
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Jong, de, ISM, Boumen, R, Mortel - Fronczak, van de, JM & Rooda, JE 2007, Integration and test planning patterns in different organizations. in J Tretmans (ed.), Tangram: Model-based integration and testing of complex high-tech systems. Embedded Systems Institute, Eindhoven, pp. 31-44.

Integration and test planning patterns in different organizations. / Jong, de, I.S.M.; Boumen, R.; Mortel - Fronczak, van de, J.M.; Rooda, J.E.

Tangram: Model-based integration and testing of complex high-tech systems. ed. / J. Tretmans. Eindhoven : Embedded Systems Institute, 2007. p. 31-44.

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

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BT - Tangram: Model-based integration and testing of complex high-tech systems

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Jong, de ISM, Boumen R, Mortel - Fronczak, van de JM, Rooda JE. Integration and test planning patterns in different organizations. In Tretmans J, editor, Tangram: Model-based integration and testing of complex high-tech systems. Eindhoven: Embedded Systems Institute. 2007. p. 31-44