Integrated multi-pixel near-infrared spectral sensor

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Abstract

An integrated semiconductor spectral sensor is demonstrated. It is based on an array of resonant- cavity-enhanced photodetectors covering the short-wavelength infrared region. Its robustness and small footprint make this device suitable for on-site spectral sensing applications.
Original languageEnglish
Title of host publicationProceedings of Applied Industrial Spectroscopy 2020 Washington, DC United States 22–26 June 2020
PublisherOptical Society of America (OSA)
Number of pages2
ISBN (Electronic)978-1-943580-78-1
DOIs
Publication statusPublished - 22 Jun 2020
EventApplied Industrial Spectroscopy 2020
- Washington, United States
Duration: 22 Jun 202026 Jun 2020

Conference

ConferenceApplied Industrial Spectroscopy 2020
Country/TerritoryUnited States
CityWashington
Period22/06/2026/06/20

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