Abstract
An integrated semiconductor spectral sensor is demonstrated. It is based on an array of resonant- cavity-enhanced photodetectors covering the short-wavelength infrared region. Its robustness and small footprint make this device suitable for on-site spectral sensing applications.
Original language | English |
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Title of host publication | Proceedings of Applied Industrial Spectroscopy 2020 Washington, DC United States 22–26 June 2020 |
Publisher | Optical Society of America (OSA) |
Number of pages | 2 |
ISBN (Electronic) | 978-1-943580-78-1 |
DOIs | |
Publication status | Published - 22 Jun 2020 |
Event | Applied Industrial Spectroscopy 2020 - Washington, United States Duration: 22 Jun 2020 → 26 Jun 2020 |
Conference
Conference | Applied Industrial Spectroscopy 2020 |
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Country/Territory | United States |
City | Washington |
Period | 22/06/20 → 26/06/20 |