Integrated DIC based HR-EBSD: High accuracy and robustness

Tijmen Vermeij, J.P.M. Hoefnagels

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2018
A consistent full-field integrated DIC framework for HR-EBSD
Vermeij, T. & Hoefnagels, J. P. M., 1 Aug 2018, In: Ultramicroscopy. 191, p. 44-50 7 p.
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