Integrated DIC based HR-EBSD: High accuracy and robustness

Tijmen Vermeij, J.P.M. Hoefnagels

Research output: Contribution to conference › Poster

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Original language	English
DOIs	https://doi.org/10.13140/RG.2.2.18834.96962
Publication status	Published - 1 Apr 2018
Event	EBSD 2018 - Plymouth, United Kingdom Duration: 10 Apr 2018 → 11 Apr 2018

Conference

Conference	EBSD 2018
Country/Territory	United Kingdom
City	Plymouth
Period	10/04/18 → 11/04/18

Access to Document

10.13140/RG.2.2.18834.96962

posterFinal published version, 3.64 MB

1 Article

A consistent full-field integrated DIC framework for HR-EBSD
Vermeij, T. & Hoefnagels, J. P. M., 1 Aug 2018, In: Ultramicroscopy. 191, p. 44-50 7 p.
Research output: Contribution to journal › Article › Academic › peer-review

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