Integrated circuit defect-sensitivity : theory and computational models

Research output: Book/ReportBookAcademic

Original languageEnglish
Place of PublicationDordrecht
PublisherKluwer Academic Publishers
Number of pages167
ISBN (Electronic)978-1-4615-3158-6
ISBN (Print)978-0-7923-9306-1, 0-7923-9306-6
DOIs
Publication statusPublished - 1993
Externally publishedYes

Publication series

NameThe Kluwer international series in engineering and computer science. SECS
Volume208
ISSN (Print)0893-3405

Cite this

Pineda de Gyvez, J. (1993). Integrated circuit defect-sensitivity : theory and computational models. (The Kluwer international series in engineering and computer science. SECS; Vol. 208). Kluwer Academic Publishers. https://doi.org/10.1007/978-1-4615-3158-6